SiC Detector Meeting

→ Asia/Shanghai
B424 (IHEP)

B424

IHEP

Description

#腾讯会议:527-3936-3179

https://meeting.tencent.com/dm/cz12loyfySOU

手机一键拨号入会

+8675536550000,,52739363179# (中国大陆)

+8675536550000 (中国大陆)

    • 10:00 → 10:05
      损伤分析 5m
      Speaker: Xin Shi (IHEP)
    • 10:05 → 10:30
      金半接触及金属化工艺 25m
      Speaker: 晓川 夏 (Dalian University of Technology)
    • 10:30 → 10:50
      Electrical Characteristics of Neutron-irradiated GaN Shottky Barrier Diodes 20m
      Speaker: 嘉祥 陈 (shanghaiTech University)
    • 10:50 → 11:10
      碳化硅损伤分析研究 20m
      Speaker: 希媛 张