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MOST2 chip design meeting

Asia/Shanghai

  1. Tianya reported the test status of the Tcpx1 chip. The chip analog output showed expected and reasonable response by using Sr90 source. The area imaging experiment also showed that the FE-I3 part can response to the Sr90, while mask the data from ALPIDE's side.

  2. Wei Wei & Shuqi reported some test status of Tcpx2 chip by using the laser. The test setup was fine tuned by careful installation with necessary isolation to the platform. Some preliminary position & location experiment was carried out and reasonable results were achieved. We also scanned some character shaped light spots to prove the full setup.

  3. Wang Jia continued to debug the LDO block. It was found when the current consuming of the load rised up, the output voltage of the LDO will drop off, until the load was unfunctioned. The simulation preliminary proved this phenomena while some details were different. 

There are minutes attached to this event. Show them.
    • TCX1 test
      slides
    • 1
      laser test
      Slides
    • 2
      Position resolution from Laser test
      Speaker: Ms Shuqi Li (IHEP)
      Slides