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The DarkSHINE experiment proposes a novel approach to single-electron-on-fixed-target exploration, focusing on the search for dark photons through its invisible decay to dark matter particles. Central to its design is the tracker detector, engineered to deliver exceptional sensitivity in detecting light dark matter candidates. Leveraging advancements in detector technology, particularly the emergence of AC-coupled Low Gain Avalanche Diode (AC-LGAD), this paper investigates the performance of several prototype AC-LGAD strip sensors tailored for the DarkSHINE tracking detector. The study evaluates the electrical characteristics of these sensors across two batches of wafers with varying n+ doses. The spatial and time resolution are also measured with infrared laser source. The measured spatial resolutions range from 6.5 $\mathrm{\mu m}$ to 8.2 $\mathrm{\mu m}$ and from 8.8 $\mathrm{\mu m}$ to 12.3 $\mathrm{\mu m}$ for AC-LGAD sensors from two different dose batches, featuring a 100 $\mathrm{\mu m}$ pitch size. Furthermore, time measurement resolutions of 8.3 ps and 11.4 ps are achieved which underscores the promising performance of AC-LGAD technology in advancing the capabilities of DarkSHINE's tracking system.