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基于未来电子缪子对撞机的带电轻子味道破坏过程研究

Not scheduled
20m
Poster TeV物理和超出标准模型新物理 分会场一

Speaker

Ran Ding (Sun Yat-sen University)

Description

带电轻子味道破坏(cLFV)过程在标准模型内受中微子质量影响被严重压低,而在多种新物理模型中却可能被提高到实验可观测的量级,因此是新物理模型研究的重要信号之一。考虑到电子缪子相互作用的独特优势,我们研究了未来电子缪子对撞机上由额外引入的中性规范玻色子$Z$'传播的cLFV过程。基于蒙特卡洛计算和检测器快速模拟,我们对cLFV信号和可能的本底的特征进行了研究,并给出了信号在90%置信水平下的截面上限和对应耦合常数$\lambda_{e\mu}$和$\lambda_{e\tau}$的结果。对比当前实验上限与未来实验预期,电子缪子对撞在含陶子末态的耦合常数灵敏度上表现出显著优势。与此同时,轻子对撞实验还可对当前缺乏研究的$\lambda_{\mu\mu}×\lambda_{e\mu}$过程进行测量,且具备较好的灵敏度。

Primary authors

Qiang Li (Peking Univ.) Ran Ding (Sun Yat-sen University) Zhengyun You (Sun Yat-Sen University)

Presentation materials

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