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Impact of ANIS Beam Parameters on Single Event Burnout Testing in SiC Power Devices

Not scheduled
1m
V6 Hallway (4th floor)

V6 Hallway

4th floor

Poster session Poster Session

Speaker

Lihua Mo (CSNS)

Description

Impact of ANIS Beam Parameters on Single Event Burnout Testing in SiC Power Devices

Primary author

Lihua Mo (CSNS)

Presentation materials

There are no materials yet.