Speaker
            
    Lihua Mo
            
                (CSNS)
        
        
    Description
Impact of ANIS Beam Parameters on Single Event Burnout Testing in SiC Power Devices
Primary author
        
            
                
                
                    
                        Lihua Mo
                    
                
                
                        (CSNS)
                    
            
        
    
         
                                    