Wafer-Level Testing Challenges for ALTIROC-A ASICs in the ATLAS HGTD: Performance and Quality Control

17 Jul 2026, 08:45
15m
湛江厅 (2号楼三楼)

湛江厅

2号楼三楼

Speaker

Hancen LU (IHEP)

Description

ALTIROC-A is the front-end readout ASIC of the ATLAS High-Granularity Timing Detector (HGTD). Its large-scale production requires reliable wafer-level screening before dicing and module assembly. This contribution presents the ALTIROC-A wafer probing campaign, focusing on measured performance, including TDC and jitter characterization, wafer-to-wafer yield spread, and the constraints relevant to large-scale quality control. In the current pre-production campaign, 16 wafers have been probed at IHEP, with an average yield of about 78% under the present acceptance criteria. The contribution addresses the probing-related effects that influence chip qualification and the definition of robust screening rules for production.

请选择分会 粒子物理实验技术

Primary author

Co-authors

梁志均 LIANG Zhijun Liang Li (Shanghai Jiao Tong University) Shu Li (TDLI, SJTU) Xiang Chen (Shanghai Jiao Tong University) Jiahui Wu (SJTU) Zelin Yan (SJTU) Haidar Mas\'ud Alfanda (Tsung-Dao Lee Institute, Shanghai Jiao Tong University (CN)) Chonghao Wu (SJTU) 坤 胡 (山东大学)

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