Data analysis from the participants (grain size & dislocation)
Data analysis from the participants (planar defects. etc.)
Dr. Ammar Nejati
Dr. Baohu Wu, SANS @ MLZ/frm2
Dr. Burkhard Schillinger, Imaging @ MLZ/frm2 Prof. Jie Chen or Dr. Shengxiang Wang, Imaging @ CSNS
Dr. Chao Ding
Dr. Erxi Feng, Single Crystal Diffractometer @ CSNS
Dr. Haiyu Li
Dr. Martin Meven, Single Crystal Diffractometer @ MLZ/frm2
Dr. Michael Hofmann, Project Summary Report
Dr. Nabil H. Bhuiyan & Haichuan Guo
Dr. Weimin Gan
Dr. Wenli Song
Dr. Wenting Du
Dr. Xiaohu Li
Erik Walz & Lorenz Maier
Evaluation of asymmetric and overlapping peaks
Lijiu Wang
Opening speech: Prof. Hesheng Chen (former director of CSNS)、Prof. Sheng Wang (Director of CSNS)
Prof. He Cheng, VSANS @ CSNS
Prof. Jie Chen, Imaging @ CSNS
Prof. Martin Landesberger
Prof. Tamas Ungar, overview of line broadening profile analysis
Prof. Tianjiao Liang, Introduction to CSNS and Sino-German program
Prof. Xunli Wang,City University of Hong Kong
Satellites and diffuse scattering below the Bragg peaks
Software Practice (I): Data preparation
Software Practice (II): Quantitative characterization of crystallite size and dislocation density in cubic crystals.
Software Practice (III): Quantitative characterization of crystallite size and dislocation density in hexagonal crystals.
Software Practice (IV): Automatic evaluation of series of diffraction patterns
Software Practice (V): Quantitative characterization of planar defects
Software Practice (VI): Quantitative characterization of multiple slip systems in hexagonal crystals
Strain anisotropy and the dislocation contrast factors in cubic and hexagonal materials.
The basics of size broadening
The effect of planar defects on diffraction peak profiles
Working principles of the CMWP procedure
Wrap up and discussion Prof. Tianjiao Liang & Dr. Michael Hofmann
Include materials from selected contributions
