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May 21 – 26, 2017
Beijing International Convention Center
Asia/Shanghai timezone

Spherical Measuring Device of Secondary Electron Emission Coefficient Based on Pulsed Electron Beam

May 24, 2017, 5:24 PM
18m
Room 305C (Beijing International Convention Center)

Room 305C

Beijing International Convention Center

No.8 Beichen Dong Road, Chaoyang District, Beijing P. R. China 100101
oral Experimental detector systems R2-Experimental detector systems(4)

Speaker

Mr Kaile Wen (Institute of High Energy Physics, Chinese Academy of Sciences)

Description

In order to improve the performance of the microchannel plate, a material having a high secondary electron emission coefficient (SEEC) is required, and the SEEC of this material needs to be accurately measured. For this purpose, a SEEC measuring device with spherical collector structure was designed. The device consists of a vacuum system, a baking system, a test system, an electronic readout system, and a magnetic shield system. The measurement of the SEEC from a wide incident energy range (100eV ~ 10keV) and a large incident angle (0°~ 85 °) is realized by using the pulsed electron beam as the incident electron. The energy distribution of the secondary electrons is measured by a multi-layer grid structure. The SEEC of the metallic material was tested by using this device, which proves that the device is stable and good.

Primary author

Mr Kaile Wen (Institute of High Energy Physics, Chinese Academy of Sciences)

Co-authors

Dr Baojun YAN (高能所) Prof. Shulin Liu (Institute of High Energy Physics, Chinese Academy of Sciences) Mr Yang Yu (Institute of High Energy Physics, Chinese Academy of Sciences) Ms Yuzhen Yang (Institute of High Energy Physics, Chinese Academy of Sciences)

Presentation materials