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May 21 – 26, 2017
Beijing International Convention Center
Asia/Shanghai timezone

A New Facility for Secondary Electron Measurement

Not scheduled
Beijing International Convention Center

Beijing International Convention Center

No.8 Beichen Dong Road, Chaoyang District, Beijing P. R. China 100101
Poster Photon detectors


jinhai li (CIAE)


The secondary electron is researched in many field. In order to measurement the secondary electron angular distribution of all the solid angle, the X axis support, Y axis support is promoted. The spectral distribution of the secondary electron also can be measured. The accumulatation charge on the insulated material surface during the secondary electron measurement have very bad effects. Although many methods have been used for the charge neutralization, many defects are still not resolved. So the plasma neutralization is promoted. The plasma neutralization can also be used in the electron microscopy.

Primary author


Dr Baojun YAN (高能所) Prof. liu shulin (mcp-pmt)

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