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21-26 May 2017
Beijing International Convention Center
Asia/Shanghai timezone
Home > Timetable > Session details > Contribution details

Contribution oral

Beijing International Convention Center - Room 305C
Experimental detector systems

Spherical Measuring Device of Secondary Electron Emission Coefficient Based on Pulsed Electron Beam

Speakers

  • Mr. Kaile WEN

Primary authors

  • Mr. Kaile WEN (Institute of High Energy Physics, Chinese Academy of Sciences)

Co-authors

Content

In order to improve the performance of the microchannel plate, a material having a high secondary electron emission coefficient (SEEC) is required, and the SEEC of this material needs to be accurately measured. For this purpose, a SEEC measuring device with spherical collector structure was designed. The device consists of a vacuum system, a baking system, a test system, an electronic readout system, and a magnetic shield system. The measurement of the SEEC from a wide incident energy range (100eV ~ 10keV) and a large incident angle (0°~ 85 °) is realized by using the pulsed electron beam as the incident electron. The energy distribution of the secondary electrons is measured by a multi-layer grid structure. The SEEC of the metallic material was tested by using this device, which proves that the device is stable and good.