1. If you are a new user, please register to get an Indico account through https://login.ihep.ac.cn/registIndico.jsp. Any questions, please email us at helpdesk@ihep.ac.cn or call 88236855.
2. The name of any uploaded file should be in English or plus numbers, not containing any Chinese or special characters.
3. If you need to create a conference in the "Conferences, Workshops and Events" zone, please email us at helpdesk@ihep.ac.cn.
21-26 May 2017
Beijing International Convention Center
Asia/Shanghai timezone
Home > Timetable > Session details > Contribution details

Contribution oral

Beijing International Convention Center - Room 305C
Experimental detector systems

Spherical Measuring Device of Secondary Electron Emission Coefficient Based on Pulsed Electron Beam


  • Mr. Kaile WEN

Primary authors

  • Mr. Kaile WEN (Institute of High Energy Physics, Chinese Academy of Sciences)



In order to improve the performance of the microchannel plate, a material having a high secondary electron emission coefficient (SEEC) is required, and the SEEC of this material needs to be accurately measured. For this purpose, a SEEC measuring device with spherical collector structure was designed. The device consists of a vacuum system, a baking system, a test system, an electronic readout system, and a magnetic shield system. The measurement of the SEEC from a wide incident energy range (100eV ~ 10keV) and a large incident angle (0°~ 85 °) is realized by using the pulsed electron beam as the incident electron. The energy distribution of the secondary electrons is measured by a multi-layer grid structure. The SEEC of the metallic material was tested by using this device, which proves that the device is stable and good.