1. IE browser is NOT supported anymore. Please use Chrome, Firefox or Edge instead.
2. If you are a new user, please register to get an IHEP SSO account through https://login.ihep.ac.cn/registlight.jsp Any questions, please email us at helpdesk@ihep.ac.cn or call 88236855.
3. If you need to create a conference in the "Conferences, Workshops and Events" zone, please email us at helpdesk@ihep.ac.cn.
4. The max file size allowed for upload is 100 Mb.

National Electrostatics Corp: Product Overview & Discussion

MFS-3
22 Oct 2024, 15:30
20m
GRAND BALLROOM (宴会厅), 2nd Floor

GRAND BALLROOM (宴会厅), 2nd Floor

GULIN BRAVO HOTEL (桂林宾馆),14 Ronghu Road, Guilin, 541002, China
Oral Presentation Manufacturers Session Manufacturers Session

Speaker

Mark Sundquist (National Electrostatics Corp.)

Description

We present a brief overview of the National Electrostatics Corp. (NEC) AMS systems over the last 30 years, leading the transition from multi-MV tandems to compact sub-MV tandems, CAMS, XCAMS and UAMS, and even lower energy single-stage SSAMS and the positive ion system, PIMS.

We will also discuss three recent beamline components that are now being installed in NEC state-of-the-art AMS systems. We will describe the result of the evolution of the ubiquitous NEC BPM80 beam-profile monitor series into the stepper-motor driven BPM90 series and present data from a new low-current BPM model capable of measuring beam location and profile for beam currents from 1 picoamp to over 12microamp, an eight-decade range.

We will also describe a current-measuring system that is also capable of measuring sub-pA beam currents, and the new variable Pulsed Beam Attenuator that facilitated the testing of the two low-current components.

Student Submission No

Primary author

Mark Sundquist (National Electrostatics Corp.)

Presentation materials

There are no materials yet.