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May 21 – 26, 2017
Beijing International Convention Center
Asia/Shanghai timezone

Secondary electron yield of nano-thick aluminum oxide and its application on MCP detector

May 25, 2017, 2:54 PM
Room 307 (Beijing International Convention Center)

Room 307

Beijing International Convention Center

No.8 Beichen Dong Road, Chaoyang District, Beijing P. R. China 100101
oral Semiconductor detectors R4-Semiconductor detectors(6)


Dr Yan Baojun (IHEP)


The secondary electron properties of nano-thick aluminum oxide have been studied. The MCP assembly performance improvement through coating aluminum oxide is investigated. The gain, the charge resolution and the peak-to-valley ratio of the MCP detector are improved. Two possible solutions are proposed to improve the maximum yield with reduced optimal energy of secondary electron emission materials.

Primary author

Dr Yan Baojun (IHEP)


Prof. Liu Shulin (IHEP) Dr Wen Kaile (IHEP)

Presentation materials