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21-26 May 2017
Beijing International Convention Center
Asia/Shanghai timezone
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Contribution oral

Beijing International Convention Center - Room 307
Semiconductor detectors

Secondary electron yield of nano-thick aluminum oxide and its application on MCP detector


The secondary electron properties of nano-thick aluminum oxide have been studied. The MCP assembly performance improvement through coating aluminum oxide is investigated. The gain, the charge resolution and the peak-to-valley ratio of the MCP detector are improved. Two possible solutions are proposed to improve the maximum yield with reduced optimal energy of secondary electron emission materials.