Speaker
Dr
Yan Baojun
(IHEP)
Description
The secondary electron properties of nano-thick aluminum oxide have been studied. The MCP assembly performance improvement through coating aluminum oxide is investigated. The gain, the charge resolution and the peak-to-valley ratio of the MCP detector are improved. Two possible solutions are proposed to improve the maximum yield with reduced optimal energy of secondary electron emission materials.
Primary author
Dr
Yan Baojun
(IHEP)
Co-authors
Prof.
Liu Shulin
(IHEP)
Dr
Wen Kaile
(IHEP)
