Prof. Thomas Hase is an experimental condensed-matter physicist at the University of Warwick whose research connects magnetic thin-film physics, functional materials and large-scale facility science. His work uses X-ray reflectivity, including resonant magnetic reflectivity, as well as X-ray scattering, X-ray absorption spectroscopy and synchrotron-based methods to reveal how structure, composition and buried interfaces govern magnetic, electronic and functional behaviour in complex materials. A particular emphasis of his research is the analysis of reflectivity data to determine depth-resolved structural, chemical and magnetic profiles in thin films, multilayers and heterostructures. His wider programme spans magnetic and non-magnetic functional materials, including spintronic systems, ferroic materials, patterned structures, semiconductor heterostructures and complex multilayers. In parallel, he has developed data-analysis approaches in SIMS, using energy sequencing to recover high-resolution chemical depth profiles from buried-interface systems.
At Warwick, Prof. Hase is Director of the XMaS National Facility at the European Synchrotron Radiation Facility, supporting UK materials research through access to advanced synchrotron techniques. He has also played leading roles in the wider central-facilities community, having chaired the Diamond Light Source Science Advisory Committee and User Committee, serving on neutron and synchrotron beamtime-allocation panels, and contributing to national and international advisory activities for large-scale experimental facilities. He has published over 120 peer-reviewed papers and co-authored Measurements and their Uncertainties: A Practical Guide to Modern Error Analysis, an Oxford University Press textbook widely used in undergraduate STEM education.
